Aging and doping effects of nano-structured MgxZn1-xO thin films for CNT applications

This paper reports on the preparation of nanostructured of Mg xZn1-xO thin films by sol-gel spin coating method which will be used as a template layer to grow carbon nanotubes. The Mg xZn1-xO films were deposited on PtlSi (100) substrates. In this work, we focused on the effect of sol aging and Mg c...

Full description

Bibliographic Details
Published in:Proceeding, 2010 IEEE Student Conference on Research and Development - Engineering: Innovation and Beyond, SCOReD 2010
Main Author: Ahmad R.; Salina M.; Awang Teh A.; Kara M.; Rusop M.; Awang Z.
Format: Conference paper
Language:English
Published: 2010
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-79951993887&doi=10.1109%2fSCORED.2010.5704032&partnerID=40&md5=bbc5bb859a036e3ad6f40f76017013f4
id 2-s2.0-79951993887
spelling 2-s2.0-79951993887
Ahmad R.; Salina M.; Awang Teh A.; Kara M.; Rusop M.; Awang Z.
Aging and doping effects of nano-structured MgxZn1-xO thin films for CNT applications
2010
Proceeding, 2010 IEEE Student Conference on Research and Development - Engineering: Innovation and Beyond, SCOReD 2010


10.1109/SCORED.2010.5704032
https://www.scopus.com/inward/record.uri?eid=2-s2.0-79951993887&doi=10.1109%2fSCORED.2010.5704032&partnerID=40&md5=bbc5bb859a036e3ad6f40f76017013f4
This paper reports on the preparation of nanostructured of Mg xZn1-xO thin films by sol-gel spin coating method which will be used as a template layer to grow carbon nanotubes. The Mg xZn1-xO films were deposited on PtlSi (100) substrates. In this work, we focused on the effect of sol aging and Mg content on the film structure and resistivity. Sols with Mg content of x = 0.1, 0.3 and 0.5 were subjected to aging times of between 3 to 240 hours. X-Ray Diffractometer (XRD), energy dispersive analysis by X-ray (EDAX), scanning (SEM) and field emission scanning electron (FESEM) microscopes were used to characterize the structural properties. Results from SEM and FESEM show the thickness and grain size increased with aging up to 240 hours. XRD spectrum reveals the deposited thin films were poly crystalline wurtzite structure. The element of Mg in the ZnO films was confirmed by EDAX. The electrical resistivity also increased with aging time as confirmed by four point probe method. The results suggest that appropriate aging of the sol is important for improving structure quality and electrical performance of MgxZn1-xO thin films. ©2010 IEEE.


English
Conference paper

author Ahmad R.; Salina M.; Awang Teh A.; Kara M.; Rusop M.; Awang Z.
spellingShingle Ahmad R.; Salina M.; Awang Teh A.; Kara M.; Rusop M.; Awang Z.
Aging and doping effects of nano-structured MgxZn1-xO thin films for CNT applications
author_facet Ahmad R.; Salina M.; Awang Teh A.; Kara M.; Rusop M.; Awang Z.
author_sort Ahmad R.; Salina M.; Awang Teh A.; Kara M.; Rusop M.; Awang Z.
title Aging and doping effects of nano-structured MgxZn1-xO thin films for CNT applications
title_short Aging and doping effects of nano-structured MgxZn1-xO thin films for CNT applications
title_full Aging and doping effects of nano-structured MgxZn1-xO thin films for CNT applications
title_fullStr Aging and doping effects of nano-structured MgxZn1-xO thin films for CNT applications
title_full_unstemmed Aging and doping effects of nano-structured MgxZn1-xO thin films for CNT applications
title_sort Aging and doping effects of nano-structured MgxZn1-xO thin films for CNT applications
publishDate 2010
container_title Proceeding, 2010 IEEE Student Conference on Research and Development - Engineering: Innovation and Beyond, SCOReD 2010
container_volume
container_issue
doi_str_mv 10.1109/SCORED.2010.5704032
url https://www.scopus.com/inward/record.uri?eid=2-s2.0-79951993887&doi=10.1109%2fSCORED.2010.5704032&partnerID=40&md5=bbc5bb859a036e3ad6f40f76017013f4
description This paper reports on the preparation of nanostructured of Mg xZn1-xO thin films by sol-gel spin coating method which will be used as a template layer to grow carbon nanotubes. The Mg xZn1-xO films were deposited on PtlSi (100) substrates. In this work, we focused on the effect of sol aging and Mg content on the film structure and resistivity. Sols with Mg content of x = 0.1, 0.3 and 0.5 were subjected to aging times of between 3 to 240 hours. X-Ray Diffractometer (XRD), energy dispersive analysis by X-ray (EDAX), scanning (SEM) and field emission scanning electron (FESEM) microscopes were used to characterize the structural properties. Results from SEM and FESEM show the thickness and grain size increased with aging up to 240 hours. XRD spectrum reveals the deposited thin films were poly crystalline wurtzite structure. The element of Mg in the ZnO films was confirmed by EDAX. The electrical resistivity also increased with aging time as confirmed by four point probe method. The results suggest that appropriate aging of the sol is important for improving structure quality and electrical performance of MgxZn1-xO thin films. ©2010 IEEE.
publisher
issn
language English
format Conference paper
accesstype
record_format scopus
collection Scopus
_version_ 1809677612666060800