Visible luminescence of nanoporous silicon using alternating current photo-assisted electrochemical etching for potential MSM photodetector

The formation of nanocrystalline porous silicon (PS) was successfully prepared under a novel alternating current (sine-wave a.c. (50 Hz)) photo-assisted electrochemical (ACPEC) etching condition of an n-type (100) silicon (Si) substrate under the illumination of an incandescent white light. As grown...

Full description

Bibliographic Details
Published in:Materials Science Forum
Main Author: Mahmood A.; Hassan Z.; Ahmed N.M.; Shahiri E.; Abd Rahim A.F.; Abdullah M.S.
Format: Conference paper
Language:English
Published: Trans Tech Publications Ltd 2016
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84964871223&doi=10.4028%2fwww.scientific.net%2fMSF.846.274&partnerID=40&md5=fc11bc9c9293ba59f53f4b955b88115c
id 2-s2.0-84964871223
spelling 2-s2.0-84964871223
Mahmood A.; Hassan Z.; Ahmed N.M.; Shahiri E.; Abd Rahim A.F.; Abdullah M.S.
Visible luminescence of nanoporous silicon using alternating current photo-assisted electrochemical etching for potential MSM photodetector
2016
Materials Science Forum
846

10.4028/www.scientific.net/MSF.846.274
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84964871223&doi=10.4028%2fwww.scientific.net%2fMSF.846.274&partnerID=40&md5=fc11bc9c9293ba59f53f4b955b88115c
The formation of nanocrystalline porous silicon (PS) was successfully prepared under a novel alternating current (sine-wave a.c. (50 Hz)) photo-assisted electrochemical (ACPEC) etching condition of an n-type (100) silicon (Si) substrate under the illumination of an incandescent white light. As grown Si and PS through conventional direct current(DC) anodization were also included for comparison. The ACPEC formed porous Silicon (PS) with excellent structural and surface morphological characteristic. According to the field emission scanning electron microscope (FESEM) micrographs, the nanoporous structures exhibited pores with uniform circular structure with estimated sizes, ranging between 20.5 nm and 30.5 nm. The atomic force microscopy (AFM) revealed an increase in the surface roughness induced by porosification. As compared to the asgrown Si, PS by AC method exhibited a substantial visible photoluminescence (PL) intensity enhancement with blue-shift associated with the quantum confinement effect of the nanostructure Si. Thermally treated nickel (Ni) finger contact was deposited on the PS to form MSM photodetector. Ni/PS MSM photodetector showed lower dark and higher photocurrent compared to the as grown Si device. © 2016 Trans Tech Publications, Switzerland.
Trans Tech Publications Ltd
2555476
English
Conference paper

author Mahmood A.; Hassan Z.; Ahmed N.M.; Shahiri E.; Abd Rahim A.F.; Abdullah M.S.
spellingShingle Mahmood A.; Hassan Z.; Ahmed N.M.; Shahiri E.; Abd Rahim A.F.; Abdullah M.S.
Visible luminescence of nanoporous silicon using alternating current photo-assisted electrochemical etching for potential MSM photodetector
author_facet Mahmood A.; Hassan Z.; Ahmed N.M.; Shahiri E.; Abd Rahim A.F.; Abdullah M.S.
author_sort Mahmood A.; Hassan Z.; Ahmed N.M.; Shahiri E.; Abd Rahim A.F.; Abdullah M.S.
title Visible luminescence of nanoporous silicon using alternating current photo-assisted electrochemical etching for potential MSM photodetector
title_short Visible luminescence of nanoporous silicon using alternating current photo-assisted electrochemical etching for potential MSM photodetector
title_full Visible luminescence of nanoporous silicon using alternating current photo-assisted electrochemical etching for potential MSM photodetector
title_fullStr Visible luminescence of nanoporous silicon using alternating current photo-assisted electrochemical etching for potential MSM photodetector
title_full_unstemmed Visible luminescence of nanoporous silicon using alternating current photo-assisted electrochemical etching for potential MSM photodetector
title_sort Visible luminescence of nanoporous silicon using alternating current photo-assisted electrochemical etching for potential MSM photodetector
publishDate 2016
container_title Materials Science Forum
container_volume 846
container_issue
doi_str_mv 10.4028/www.scientific.net/MSF.846.274
url https://www.scopus.com/inward/record.uri?eid=2-s2.0-84964871223&doi=10.4028%2fwww.scientific.net%2fMSF.846.274&partnerID=40&md5=fc11bc9c9293ba59f53f4b955b88115c
description The formation of nanocrystalline porous silicon (PS) was successfully prepared under a novel alternating current (sine-wave a.c. (50 Hz)) photo-assisted electrochemical (ACPEC) etching condition of an n-type (100) silicon (Si) substrate under the illumination of an incandescent white light. As grown Si and PS through conventional direct current(DC) anodization were also included for comparison. The ACPEC formed porous Silicon (PS) with excellent structural and surface morphological characteristic. According to the field emission scanning electron microscope (FESEM) micrographs, the nanoporous structures exhibited pores with uniform circular structure with estimated sizes, ranging between 20.5 nm and 30.5 nm. The atomic force microscopy (AFM) revealed an increase in the surface roughness induced by porosification. As compared to the asgrown Si, PS by AC method exhibited a substantial visible photoluminescence (PL) intensity enhancement with blue-shift associated with the quantum confinement effect of the nanostructure Si. Thermally treated nickel (Ni) finger contact was deposited on the PS to form MSM photodetector. Ni/PS MSM photodetector showed lower dark and higher photocurrent compared to the as grown Si device. © 2016 Trans Tech Publications, Switzerland.
publisher Trans Tech Publications Ltd
issn 2555476
language English
format Conference paper
accesstype
record_format scopus
collection Scopus
_version_ 1809677910896803840