APA引文

G, A. K. S. C. J. P. J. S. P. J. (2019). Local structural analysis of erbium-doped tellurite modified silica glass with x-ray photoelectron spectroscopy. Materials Research Express, 6(8), . https://doi.org/10.1088/2053-1591/ab28eb

Chicago Style (17th ed.) Citation

G, Ahmad Kamil S.; Chandrappan J.; Portoles J.; Steenson P.; Jose. "Local Structural Analysis of Erbium-doped Tellurite Modified Silica Glass with X-ray Photoelectron Spectroscopy." Materials Research Express 6, no. 8 (2019). https://doi.org/10.1088/2053-1591/ab28eb.

MLA引文

G, Ahmad Kamil S.; Chandrappan J.; Portoles J.; Steenson P.; Jose. "Local Structural Analysis of Erbium-doped Tellurite Modified Silica Glass with X-ray Photoelectron Spectroscopy." Materials Research Express, vol. 6, no. 8, 2019, https://doi.org/10.1088/2053-1591/ab28eb.