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توثيق أسلوب شيكاغو (الطبعة السابعة عشر)G, Ahmad Kamil S.; Chandrappan J.; Portoles J.; Steenson P.; Jose. "Local Structural Analysis of Erbium-doped Tellurite Modified Silica Glass with X-ray Photoelectron Spectroscopy." Materials Research Express 6, no. 8 (2019). https://doi.org/10.1088/2053-1591/ab28eb.
توثيق جمعية اللغة المعاصرة MLA (الطبعة الثامنة)G, Ahmad Kamil S.; Chandrappan J.; Portoles J.; Steenson P.; Jose. "Local Structural Analysis of Erbium-doped Tellurite Modified Silica Glass with X-ray Photoelectron Spectroscopy." Materials Research Express, vol. 6, no. 8, 2019, https://doi.org/10.1088/2053-1591/ab28eb.