Influence of Pre-Sputtering Technique on Material Properties of BST Thin Films for Tunable Microwave Applications

This paper focuses on the influence of pre-sputtering process on the material properties of RF sputtered Barium Strontium Titanate (BST) thin films. Ba0.5Sr0.5TiO3 thin films were synthesized on sapphire substrates via RF magnetron sputtering system for 2-, 3- and 4-hour deposition time. The samples...

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Published in:2020 IEEE International RF and Microwave Conference, RFM 2020 - Proceeding
Main Author: Jamaluddin F.W.; Khalid M.F.A.; Zoolfakar A.S.; Mamat M.H.; Mohd Nasir N.F.
Format: Conference paper
Language:English
Published: Institute of Electrical and Electronics Engineers Inc. 2020
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85101699219&doi=10.1109%2fRFM50841.2020.9344774&partnerID=40&md5=8630cc43383f0de8f8b4c58055014f5d
id 2-s2.0-85101699219
spelling 2-s2.0-85101699219
Jamaluddin F.W.; Khalid M.F.A.; Zoolfakar A.S.; Mamat M.H.; Mohd Nasir N.F.
Influence of Pre-Sputtering Technique on Material Properties of BST Thin Films for Tunable Microwave Applications
2020
2020 IEEE International RF and Microwave Conference, RFM 2020 - Proceeding


10.1109/RFM50841.2020.9344774
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85101699219&doi=10.1109%2fRFM50841.2020.9344774&partnerID=40&md5=8630cc43383f0de8f8b4c58055014f5d
This paper focuses on the influence of pre-sputtering process on the material properties of RF sputtered Barium Strontium Titanate (BST) thin films. Ba0.5Sr0.5TiO3 thin films were synthesized on sapphire substrates via RF magnetron sputtering system for 2-, 3- and 4-hour deposition time. The samples were then post-annealed for 2 hours at 900 °C in conventional furnace and characterized using x-ray diffraction (XRD), atomic force microscopy (AFM), field emission scanning electron (FESEM) and energy dispersive x-ray (EDX). The AFM analysis revealed that the BST thin film of the 4-hour deposition time produces rougher surface due to larger grain size. All the XRD patterns observed to have intense (110) peaks, indicating the preferred orientation of the BST thin films. From the FESEM results, it is observed that the 3-hour deposited sample is denser and uniform compared to its 2-hour counterpart. However, the 4-hour deposited sample shows a non-uniform film. EDX analysis showed that the elemental composition of the 4-hour deposited sample is the closest to the ideal atomic concentration (at. %) of the BST thin film. © 2020 IEEE.
Institute of Electrical and Electronics Engineers Inc.

English
Conference paper

author Jamaluddin F.W.; Khalid M.F.A.; Zoolfakar A.S.; Mamat M.H.; Mohd Nasir N.F.
spellingShingle Jamaluddin F.W.; Khalid M.F.A.; Zoolfakar A.S.; Mamat M.H.; Mohd Nasir N.F.
Influence of Pre-Sputtering Technique on Material Properties of BST Thin Films for Tunable Microwave Applications
author_facet Jamaluddin F.W.; Khalid M.F.A.; Zoolfakar A.S.; Mamat M.H.; Mohd Nasir N.F.
author_sort Jamaluddin F.W.; Khalid M.F.A.; Zoolfakar A.S.; Mamat M.H.; Mohd Nasir N.F.
title Influence of Pre-Sputtering Technique on Material Properties of BST Thin Films for Tunable Microwave Applications
title_short Influence of Pre-Sputtering Technique on Material Properties of BST Thin Films for Tunable Microwave Applications
title_full Influence of Pre-Sputtering Technique on Material Properties of BST Thin Films for Tunable Microwave Applications
title_fullStr Influence of Pre-Sputtering Technique on Material Properties of BST Thin Films for Tunable Microwave Applications
title_full_unstemmed Influence of Pre-Sputtering Technique on Material Properties of BST Thin Films for Tunable Microwave Applications
title_sort Influence of Pre-Sputtering Technique on Material Properties of BST Thin Films for Tunable Microwave Applications
publishDate 2020
container_title 2020 IEEE International RF and Microwave Conference, RFM 2020 - Proceeding
container_volume
container_issue
doi_str_mv 10.1109/RFM50841.2020.9344774
url https://www.scopus.com/inward/record.uri?eid=2-s2.0-85101699219&doi=10.1109%2fRFM50841.2020.9344774&partnerID=40&md5=8630cc43383f0de8f8b4c58055014f5d
description This paper focuses on the influence of pre-sputtering process on the material properties of RF sputtered Barium Strontium Titanate (BST) thin films. Ba0.5Sr0.5TiO3 thin films were synthesized on sapphire substrates via RF magnetron sputtering system for 2-, 3- and 4-hour deposition time. The samples were then post-annealed for 2 hours at 900 °C in conventional furnace and characterized using x-ray diffraction (XRD), atomic force microscopy (AFM), field emission scanning electron (FESEM) and energy dispersive x-ray (EDX). The AFM analysis revealed that the BST thin film of the 4-hour deposition time produces rougher surface due to larger grain size. All the XRD patterns observed to have intense (110) peaks, indicating the preferred orientation of the BST thin films. From the FESEM results, it is observed that the 3-hour deposited sample is denser and uniform compared to its 2-hour counterpart. However, the 4-hour deposited sample shows a non-uniform film. EDX analysis showed that the elemental composition of the 4-hour deposited sample is the closest to the ideal atomic concentration (at. %) of the BST thin film. © 2020 IEEE.
publisher Institute of Electrical and Electronics Engineers Inc.
issn
language English
format Conference paper
accesstype
record_format scopus
collection Scopus
_version_ 1809677895678820352