B.T, M. A. M. L. M. S. N. S. P. J. L. S. T. (2024). Design and Development of Testing Kit for KNX Devices Reliability and Performance Measurement. IEEE International Conference on Industrial Engineering and Engineering Management. https://doi.org/10.1109/IEEM62345.2024.10857268
Chicagoスタイル(17版)引用形式B.T, Mohammad Aizam M.A.R.; Lee M.F.; Sanusi N.A.; Siew P.W.; Johnson Lim S.C.; Tee. "Design and Development of Testing Kit for KNX Devices Reliability and Performance Measurement." IEEE International Conference on Industrial Engineering and Engineering Management 2024. https://doi.org/10.1109/IEEM62345.2024.10857268.
MLA(8版)引用形式B.T, Mohammad Aizam M.A.R.; Lee M.F.; Sanusi N.A.; Siew P.W.; Johnson Lim S.C.; Tee. "Design and Development of Testing Kit for KNX Devices Reliability and Performance Measurement." IEEE International Conference on Industrial Engineering and Engineering Management, 2024, https://doi.org/10.1109/IEEM62345.2024.10857268.