Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method

Preparation of NiO thin films at different annealing temperature by sol-gel method was conducted to synthesize the quality of the surface thin films. The effects of annealing temperature on the surface topology were systematically investigated. Our studies confirmed that the surface roughness of the...

詳細記述

書誌詳細
出版年:AIP Conference Proceedings
第一著者: 2-s2.0-84984578942
フォーマット: Conference paper
言語:English
出版事項: American Institute of Physics Inc. 2016
オンライン・アクセス:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84984578942&doi=10.1063%2f1.4948831&partnerID=40&md5=65042819b8fd18e0693a0c257def26aa
その他の書誌記述
要約:Preparation of NiO thin films at different annealing temperature by sol-gel method was conducted to synthesize the quality of the surface thin films. The effects of annealing temperature on the surface topology were systematically investigated. Our studies confirmed that the surface roughness of the thin films was increased whenever annealing temperature was increase. NiO thin films morphology structure analysis was confirmed by field emission scanning electron microscope. Surface roughness of the thin films was investigated by atomic force microscopy. © 2016 Author(s).
ISSN:0094243X
DOI:10.1063/1.4948831