توثيق جمعية علم النفس الأمريكية APA (الطبعة السابعة)

2-s2.0-84891602122. (2014). Optical characterization of porous silicon (PS) doped Erbium (Er) using photoluminescence spectroscopy. Advanced Materials Research, 832, . https://doi.org/10.4028/www.scientific.net/AMR.832.617

توثيق أسلوب شيكاغو (الطبعة السابعة عشر)

2-s2.0-84891602122. "Optical Characterization of Porous Silicon (PS) Doped Erbium (Er) Using Photoluminescence Spectroscopy." Advanced Materials Research 832 (2014). https://doi.org/10.4028/www.scientific.net/AMR.832.617.

توثيق جمعية اللغة المعاصرة MLA (الطبعة الثامنة)

2-s2.0-84891602122. "Optical Characterization of Porous Silicon (PS) Doped Erbium (Er) Using Photoluminescence Spectroscopy." Advanced Materials Research, vol. 832, 2014, https://doi.org/10.4028/www.scientific.net/AMR.832.617.