2-s2.0-84856836437. (2011). Characterization of PZT and PNZT thin films for monolithic microwave integrated circuit applications. IEEE Region 10 Annual International Conference, Proceedings/TENCON. https://doi.org/10.1109/TENCON.2011.6129003
توثيق أسلوب شيكاغو (الطبعة السابعة عشر)2-s2.0-84856836437. "Characterization of PZT and PNZT Thin Films for Monolithic Microwave Integrated Circuit Applications." IEEE Region 10 Annual International Conference, Proceedings/TENCON 2011. https://doi.org/10.1109/TENCON.2011.6129003.
توثيق جمعية اللغة المعاصرة MLA (الطبعة الثامنة)2-s2.0-84856836437. "Characterization of PZT and PNZT Thin Films for Monolithic Microwave Integrated Circuit Applications." IEEE Region 10 Annual International Conference, Proceedings/TENCON, 2011, https://doi.org/10.1109/TENCON.2011.6129003.