Characterization of PZT and PNZT thin films for monolithic microwave integrated circuit applications

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Characterization of PZT and PNZT thin films for monolithic microwave integrated circuit applications

Ferroelectric material is widely known for its high dielectric constant. The preparation of the thin ferroelectric films is interrelated to the dielectric properties when an application is concerned. In order to investigate the dielectric properties of the film, the respective sample is characterize...

书目详细资料
发表在:	IEEE Region 10 Annual International Conference, Proceedings/TENCON
主要作者:	2-s2.0-84856836437
格式:	Conference paper
语言:	English
出版:	2011
在线阅读:	https://www.scopus.com/inward/record.uri?eid=2-s2.0-84856836437&doi=10.1109%2fTENCON.2011.6129003&partnerID=40&md5=7bfb8c18653989c8130081ca9e67256c

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