Modeling and simulation of microscopic defects in CIS-based solar cell thin film using silvaco TCAD
Reactively sputtered copper indium sulfide (CIS) chalcopyrite semiconductor has been actively studied as the potential absorber layer for solar cell thin film application. Using sputtering technique however could result in the formation of several types of defects for example microscopic defects. Mi...
| 出版年: | Proceedings - RSM 2013: 2013 IEEE Regional Symposium on Micro and Nano Electronics |
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| 第一著者: | |
| フォーマット: | Conference paper |
| 言語: | English |
| 出版事項: |
2013
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| オンライン･アクセス: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84893573627&doi=10.1109%2fRSM.2013.6706487&partnerID=40&md5=ba733bc1f5012e22b1b0f51e6b461309 |