Modeling and simulation of microscopic defects in CIS-based solar cell thin film using silvaco TCAD
Reactively sputtered copper indium sulfide (CIS) chalcopyrite semiconductor has been actively studied as the potential absorber layer for solar cell thin film application. Using sputtering technique however could result in the formation of several types of defects for example microscopic defects. Mi...
| الحاوية / القاعدة: | Proceedings - RSM 2013: 2013 IEEE Regional Symposium on Micro and Nano Electronics |
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| المؤلف الرئيسي: | |
| التنسيق: | Conference paper |
| اللغة: | English |
| منشور في: |
2013
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| الوصول للمادة أونلاين: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84893573627&doi=10.1109%2fRSM.2013.6706487&partnerID=40&md5=ba733bc1f5012e22b1b0f51e6b461309 |