Modeling and simulation of microscopic defects in CIS-based solar cell thin film using silvaco TCAD

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Modeling and simulation of microscopic defects in CIS-based solar cell thin film using silvaco TCAD

Reactively sputtered copper indium sulfide (CIS) chalcopyrite semiconductor has been actively studied as the potential absorber layer for solar cell thin film application. Using sputtering technique however could result in the formation of several types of defects for example microscopic defects. Mi...

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التفاصيل البيبلوغرافية
الحاوية / القاعدة:	Proceedings - RSM 2013: 2013 IEEE Regional Symposium on Micro and Nano Electronics
المؤلف الرئيسي:	Bakar R.A.; Herman S.H.; Hassan H.; Ahmad W.R.W.; Mohamad F.; Aminuddin M.M.
التنسيق:	Conference paper
اللغة:	English
منشور في:	2013
الوصول للمادة أونلاين:	https://www.scopus.com/inward/record.uri?eid=2-s2.0-84893573627&doi=10.1109%2fRSM.2013.6706487&partnerID=40&md5=ba733bc1f5012e22b1b0f51e6b461309

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