Design and Development of Testing Kit for KNX Devices Reliability and Performance Measurement
In the dynamic realm of building automation, the reliability and performance of KNX devices are crucial for the uninterrupted functionality of intelligent buildings. This paper presents an essential solution-a dedicated testing kit tailored for the KNX industry. Committed to elevating the quality an...
| 出版年: | IEEE International Conference on Industrial Engineering and Engineering Management |
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| 第一著者: | |
| フォーマット: | Conference paper |
| 言語: | English |
| 出版事項: |
IEEE Computer Society
2024
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| オンライン･アクセス: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85218056859&doi=10.1109%2fIEEM62345.2024.10857268&partnerID=40&md5=a377f5ff773fb75f1b913a7b9f243904 |