Fault injection test on mitigated benchmark circuits using FPGA
FPGAs (Field Programmable Gate Arrays) are integrated circuits with excellent reliability, flexibility, and capability that are widely utilized in various applications, including nuclear reactor control, aircraft, and space vehicles. However, this electronic device will perform incorrectly when expo...
| 出版年: | AIP Conference Proceedings |
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| 第一著者: | |
| フォーマット: | Conference paper |
| 言語: | English |
| 出版事項: |
American Institute of Physics Inc.
2024
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| オンライン･アクセス: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85185816454&doi=10.1063%2f5.0192276&partnerID=40&md5=576b228502db72dd4fe0af0c776a7757 |